ALL HIGH-TC EDGE-GEOMETRY WEAK LINKS UTILIZING Y-BA-CU-O BARRIER LAYERS

被引：74

作者：

HUNT, BD

FOOTE, MC

BAJUK, LJ

机构：

来源：

APPLIED PHYSICS LETTERS | 1991年 / 59卷 / 08期

关键词：

D O I：

10.1063/1.106321

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High quality YBa2Cu3O7-x/normal-metal/YBa2Cu3O7-x edge-geometry weak links have been fabricated using nonsuperconducting Y-Ba-Cu-O barrier layers deposited by laser ablation at reduced growth temperatures. Devices incorporating 25-100 angstrom thick barrier layers exhibit current-voltage characteristics consistent with the resistively shunted junction model, with strong microwave and magnetic field response at temperatures up to 85 K. The critical currents vary exponentially with barrier thickness, and the resistances scale linearly with Y-Ba-Cu-O interlayer thickness and device area, indicating good barrier uniformity, with an effective normal metal coherence length of 20 angstrom.

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页码：982 / 984

页数：3

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