ACTIVATION-ENERGY FOR SURFACE-DIFFUSION OF SI ON SI(001) - A SCANNING-TUNNELING-MICROSCOPY STUDY

被引:654
作者
MO, YW [1 ]
KLEINER, J [1 ]
WEBB, MB [1 ]
LAGALLY, MG [1 ]
机构
[1] UNIV WISCONSIN,MADISON,WI 53706
关键词
D O I
10.1103/PhysRevLett.66.1998
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The migration of Si on Si(001) has been investigated by analyzing the number density of islands formed during deposition using scanning tunneling microscopy. The activation energy and prefactor for diffusion in the fast direction, which is along the surface dimer rows, are found to be 0.67 +/- 0.08 eV and approximately 10(-3) cm2/sec, respectively.
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页码:1998 / 2001
页数:4
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