ELECTRICAL BREAKDOWN AND PITTING IN ANODIC FILMS ON TUNGSTEN IN HALOGEN ION-CONTAINING SOLUTIONS

被引：12

作者：

DIQUARTO, F

PIAZZA, S

SUNSERI, C

机构：

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 248卷 / 01期

关键词：

D O I：

10.1016/0022-0728(88)85155-6

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：117 / 129

页数：13

共 21 条

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