CHARACTERIZATION OF MULTILAYER COATINGS BY X-RAY REFLECTION

[1] BALTES HP, 1978, TOPICS CURRENT PHYSI

[2] Bates R. H. T., 1986, IMAGE RESTORATION RE

[3] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &

[4] Berning PH, 1963, PHYS THIN FILMS, V1, P69

[5] Born M., 1975, PRINCIPLES OPTICS, VFifth

[6] SURFACE-ROUGHNESS OF WATER MEASURED BY X-RAY REFLECTIVITY [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (02) : 114 - 117

[7] BRUIJN MP, 1986, THESIS FOM I AMSTERD

[8] COMPTON, 1935, XRAY THEORY EXPT

[9] THIN FILM SURFACE STUDIES BY X-RAY REFLECTION [J]. SURFACE SCIENCE, 1970, 22 (01) : 173 - +

[10] DAINTY JC, 1984, TOP APPL PHYS, V9

[1] BALTES HP, 1978, TOPICS CURRENT PHYSI

[2] Bates R. H. T., 1986, IMAGE RESTORATION RE

[3] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &

[4] Berning PH, 1963, PHYS THIN FILMS, V1, P69

[5] Born M., 1975, PRINCIPLES OPTICS, VFifth

[6] SURFACE-ROUGHNESS OF WATER MEASURED BY X-RAY REFLECTIVITY [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (02) : 114 - 117

[7] BRUIJN MP, 1986, THESIS FOM I AMSTERD

[8] COMPTON, 1935, XRAY THEORY EXPT

[9] THIN FILM SURFACE STUDIES BY X-RAY REFLECTION [J]. SURFACE SCIENCE, 1970, 22 (01) : 173 - +

[10] DAINTY JC, 1984, TOP APPL PHYS, V9