CHARACTERIZATION OF MULTILAYER COATINGS BY X-RAY REFLECTION

[21] Macleod H., 2018, THIN FILM OPTICAL FI, V5th ed.

[22] A SIMPLEX-METHOD FOR FUNCTION MINIMIZATION [J]. COMPUTER JOURNAL, 1965, 7 (04) : 308 - 313

[23] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J]. PHYSICAL REVIEW, 1954, 95 (02): : 359 - 369

[24] Ambiguities in the x-ray analysis of crystal structures [J]. PHYSICAL REVIEW, 1944, 65 (5/6): : 195 - 201

[25] SEGMULLER A, 1979, AIP C P, V53, P78

[26] PROFILE STRUCTURES OF VERY THIN MULTILAYERS BY X-RAY-DIFFRACTION USING DIRECT AND REFINEMENT METHODS OF ANALYSIS [J]. PHYSICAL REVIEW B, 1986, 34 (08): : 5826 - 5837

[27] DETERMINATION OF THICKNESS ERRORS AND BOUNDARY ROUGHNESS FROM THE MEASURED PERFORMANCE OF A MULTILAYER COATING [J]. OPTICAL ENGINEERING, 1986, 25 (08) : 954 - 963

[28] Spiller E., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P367

[29] Spiller E., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P221, DOI 10.1117/12.949671

[30] STERN F, 1963, SOLID STATE PHYS, V15, P328

[21] Macleod H., 2018, THIN FILM OPTICAL FI, V5th ed.

[22] A SIMPLEX-METHOD FOR FUNCTION MINIMIZATION [J]. COMPUTER JOURNAL, 1965, 7 (04) : 308 - 313

[23] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J]. PHYSICAL REVIEW, 1954, 95 (02): : 359 - 369

[24] Ambiguities in the x-ray analysis of crystal structures [J]. PHYSICAL REVIEW, 1944, 65 (5/6): : 195 - 201

[25] SEGMULLER A, 1979, AIP C P, V53, P78

[26] PROFILE STRUCTURES OF VERY THIN MULTILAYERS BY X-RAY-DIFFRACTION USING DIRECT AND REFINEMENT METHODS OF ANALYSIS [J]. PHYSICAL REVIEW B, 1986, 34 (08): : 5826 - 5837

[27] DETERMINATION OF THICKNESS ERRORS AND BOUNDARY ROUGHNESS FROM THE MEASURED PERFORMANCE OF A MULTILAYER COATING [J]. OPTICAL ENGINEERING, 1986, 25 (08) : 954 - 963

[28] Spiller E., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P367

[29] Spiller E., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P221, DOI 10.1117/12.949671

[30] STERN F, 1963, SOLID STATE PHYS, V15, P328