SOFT-X-RAY-INDUCED SECONDARY-ELECTRON EMISSION FROM SEMICONDUCTORS AND INSULATORS - MODELS AND MEASUREMENTS

被引：202

作者：

HENKE, BL

LIESEGANG, J

SMITH, SD

机构：

来源：

PHYSICAL REVIEW B | 1979年 / 19卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.19.3004

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3004 / 3021

页数：18

共 52 条

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