SURFACE-STRUCTURE OF SO2 ADSORBED ON NI(110) STUDIED BY S K-EDGE X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY

被引：41

作者：

TERADA, S

IMANISHI, A

YOKOYAMA, T

TAKENAKA, S

KITAJIMA, Y

OHTA, T

机构：

[1] UNIV TOKYO,SCH SCI,DEPT CHEM,BUNKYO KU,TOKYO 113,JAPAN

[2] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

SURFACE SCIENCE | 1995年 / 336卷 / 1-2期

关键词：

LOW INDEX SINGLE CRYSTAL SURFACES; NEAR EDGE EXTENDED X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); NICKEL; SULFUR DIOXIDE; SURFACE EXTENDED X-RAY ABSORPTION FINE STRUCTURE (SEXAFS); X-RAY PHOTOELECTRON SPECTROSCOPY;

D O I：

10.1016/0039-6028(95)00514-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Surface structure and electronic properties of submonolayer sulfur dioxide SO2 molecularly absorbed on Ni(110) have been investigated by means of S K-edge surface-extended X-ray absorption fine structure (SEXAFS), near-edge X-ray absorption fine structure (NEXAFS) and S1s X-ray photoemission spectroscopy (XPS) measurements. The SO2 molecule was found by SEXAFS and NEXAFS to adsorb with the molecular plane parallel to the surface and an elongated S-O bond distance compared to that of a free molecule. The S atom was revealed to locate on the long- and short-bridge sites with almost equal probabilities. No azimuthal-angle dependence was detected as for the S-O bond direction. A significant amount of charge transfer from the substrate to the SO2 pi* orbital was found by NEXAFS and XPS. Such structural and electronic properties are essentially similar to those of SO2 on Ni(100) and Ni(111).

引用

页码：55 / 62

页数：8

共 19 条

[1]

[Anonymous], 1992, NEXAFS SPECTROSCOPY, DOI DOI 10.1007/978-3-662-02853-7

[2] SO2 STRUCTURE AND REACTIVITY ON CLEAN AND SULFUR MODIFIED PD(100) [J].