Detection of subwavelength Goos-Hanchen shifts from near-field intensities: A numerical simulation

被引：26

作者：

Madrazo, A ^{[1
]}

NietoVesperinas, M ^{[1
]}

机构：

[1] UNIV AUTONOMA MADRID,FAC CIENCIAS CIII,DEPT FIS MAT CONDENSADA,E-28049 MADRID,SPAIN

来源：

OPTICS LETTERS | 1995年 / 20卷 / 24期

关键词：

D O I：

10.1364/OL.20.002445

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present an exact calculation of the frustrated total internal reflection of a beam at a dielectric interface face in the presence of a dielectic near-field detecting tip. The possibility of measuring subwavelength Goos-Hanchen lateral shifts of highly focused beams is shown. (C) 1995 Optical Society of America

引用

页码：2445 / 2447

页数：3

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