ANALYSIS OF SINGLE-CRYSTAL BRAGG-REFLECTIONS FROM PROFILE MEASUREMENTS

被引：481

作者：

GRANT, DF

GABE, EJ

机构：

[1] NATL RES COUNCIL CANADA,DIV CHEM,OTTAWA K1A 0R9,ONTARIO,CANADA

[2] UNIV ST ANDREWS,SCH PHYS SCI,ST ANDREWS KY16 9ST,FIFE,SCOTLAND

来源：

关键词：

D O I：

10.1107/S0021889878012856

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：114 / 120

页数：7

共 9 条

[1] SINGLE-CRYSTAL DIFFRACTOMETRY - IMPROVEMENT OF ACCURACY IN INTENSITY MEASUREMENTS
ALEXANDER, LE
SMITH, GS
[J]. ACTA CRYSTALLOGRAPHICA, 1964, 17 (10): : 1195 - &
[2] BLESSING RH, 1974, J APPL CRYSTALLOGR, V7, P488
[3] PROFILE ANALYSIS IN SINGLE CRYSTAL DIFFRACTOMETRY
DIAMOND, R
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 43 - &
[4] SINGLE-CRYSTAL DIFFRACTOMETER DATA - ECONOMIZING IN BACKGROUND COUNTING TIMES
GRANT, DF
GABE, EJ
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (SEP1): : 700 - 702
[5] GRANT DF, 1973, ACTA CRYST A, V29, P216
[6] METHOD FOR LOCATION OF PEAKS IN STEP-SCAN-MEASURED BRAGG-REFLECTIONS
LEHMANN, MS
LARSEN, FK
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1974, A 30 (JUL1): : 580 - 584
[7] ESTIMATED STANDARD DEVIATION OF A STEP-SCAN-MEASURED BRAGG REFLECTION INTENSITY
LEHMANN, MS
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (DEC1) : 619 - 622
[8] GAUSSIAN PROFILE ANALYSIS IN COMPUTER-CONTROLLED SINGLE-CRYSTAL DIFFRACTOMETRY
NORRESTAM, R
[J]. ACTA CHEMICA SCANDINAVICA, 1972, 26 (08): : 3226 - 3234
[9] A PEAK-SEARCH METHOD FOR AUTOMATIC DIFFRACTOMETRY
SLAUGHTER, M
[J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1969, 129 (5-6): : 369 - +