METHYL RADICAL PRODUCTION IN A HOT FILAMENT CVD SYSTEM

被引:31
作者
MENNINGEN, KL [1 ]
CHILDS, MA [1 ]
CHEVAKO, P [1 ]
TOYODA, H [1 ]
ANDERSON, LW [1 ]
LAWLER, JE [1 ]
机构
[1] NAGOYA UNIV,DEPT ELECT ENGN,CHIKUSA KU,NAGOYA 46401,JAPAN
关键词
D O I
10.1016/0009-2614(93)89207-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The absolute concentration of methyl radicals is measured in a hot filament chemical vapor deposition system for a range of filament temperatures and input ps compositions by using ultrasensitive optical absorption with a multi-element detector at wavelengths near 216 nm. The results yield effective activation energies for CH3 production and indicate that CH3 production is dominated by the gas-phase atomic hydrogen abstraction reaction when the input gas contains CH4 and H-2. We find that passing almost-equal-to 1% tert-butyl peroxide in H-2 over a hot filament is also an efficient CH3 source, and has an activation energy similar to the activation energy for the production of CH3 from CH4.
引用
收藏
页码:573 / 577
页数:5
相关论文
共 13 条
[1]   HYDROGEN-ATOM DETECTION IN THE FILAMENT-ASSISTED DIAMOND DEPOSITION ENVIRONMENT [J].
CELII, FG ;
BUTLER, JE .
APPLIED PHYSICS LETTERS, 1989, 54 (11) :1031-1033
[2]  
CELII FG, 1991, NEW DIAMOND SCI TECH, V1, P201
[3]   DETECTION OF CH3 DURING CVD GROWTH OF DIAMOND BY OPTICAL-ABSORPTION [J].
CHILDS, MA ;
MENNINGEN, KL ;
CHEVAKO, P ;
SPELLMEYER, NW ;
ANDERSON, LW ;
LAWLER, JE .
PHYSICS LETTERS A, 1992, 171 (1-2) :87-89
[4]   MECHANISM OF DIAMOND FILM GROWTH BY HOT-FILAMENT CVD - C-13 STUDIES [J].
CHU, CJ ;
DEVELYN, MP ;
HAUGE, RH ;
MARGRAVE, JL .
JOURNAL OF MATERIALS RESEARCH, 1990, 5 (11) :2405-2413
[5]  
DAVIDSON DF, IN PRESS J QUANT SPE
[6]  
Dutton J., 1975, Journal of Physical and Chemical Reference Data, V4, P577, DOI 10.1063/1.555525
[7]   GROWTH-MECHANISM OF VAPOR-DEPOSITED DIAMOND [J].
FRENKLACH, M ;
SPEAR, KE .
JOURNAL OF MATERIALS RESEARCH, 1988, 3 (01) :133-140
[8]   METHYL RADICAL AND H-ATOM CONCENTRATIONS DURING DIAMOND GROWTH [J].
HARRIS, SJ ;
WEINER, AM .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (10) :6520-6526