EFFECT OF HEATING SIH4 ON THE PLASMA CHEMICAL-VAPOR-DEPOSITION OF HYDROGENATED AMORPHOUS-SILICON

被引:8
作者
HISHIKAWA, Y
SASAKI, M
TSUGE, S
TSUDA, S
机构
[1] New Materials Research Center, Sanyo Electric Co. Ltd., Hirakata, Osaka, 573
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 7B期
关键词
AMORPHOUS SILICON; DEPOSITION; PLASMA CVD; GLOW DISCHARGE; SILANE; SURFACE REACTION; SOLAR CELL;
D O I
10.1143/JJAP.33.4373
中图分类号
O59 [应用物理学];
学科分类号
摘要
The application of vibrational/rotational energy to material gas (SiH4) and radicals by heating the material gas has been investigated in order to improve the properties of hydrogenated amorphous silicon (a-Si:H) for solar cells. It has been found that the optical gap (E(opt)) of a-Si:H films deposited from heated SiH4 (temperature of the gas heater: 280-380 degrees C) is narrower by about 20-30 meV than those of conventional films where SiH4 is not heated, using the same substrate temperature (T-s) and deposition rate (R(d)) This result suggests that the heated SiH4 molecules or related radicals promote reactions at or near the film-growing surface. In other words, applying vibrational, rotational, or translational energy to SiH4 gas has the same effect as raising T-s in plasma chemical vapor deposition (plasma-CVD) of a-Si:H. It is demonstrated that gas heating can improve the conversion efficiency of a-Si solar cells by reducing the damage to underlying layers during i-layer deposition.
引用
收藏
页码:4373 / 4376
页数:4
相关论文
共 11 条
[1]   OPTOELECTRONIC PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON FILMS DEPOSITED UNDER NEGATIVE SUBSTRATE BIAS [J].
CABARROCAS, PRI ;
MORIN, P ;
CHU, V ;
CONDE, JP ;
LIU, JZ ;
PARK, HR ;
WAGNER, S .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (05) :2942-2950
[2]   NARROW BAND-GAP A-SI-H WITH IMPROVED MINORITY CARRIER-TRANSPORT PREPARED BY CHEMICAL ANNEALING [J].
DAS, D ;
SHIRAI, H ;
HANNA, J ;
SHIMIZU, I .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1991, 30 (2B) :L239-L242
[3]  
GALLAGHER A, 1989, INT J SOLAR ENERGY, V5, P193
[4]   DEFECT FORMATION DURING GROWTH OF HYDROGENATED AMORPHOUS-SILICON [J].
GANGULY, G ;
MATSUDA, A .
PHYSICAL REVIEW B, 1993, 47 (07) :3661-3670
[5]   DEVICE-QUALITY WIDE-GAP HYDROGENATED AMORPHOUS-SILICON FILMS DEPOSITED BY PLASMA CHEMICAL VAPOR-DEPOSITION AT LOW SUBSTRATE TEMPERATURES [J].
HISHIKAWA, Y ;
TSUGE, S ;
NAKAMURA, N ;
TSUDA, S ;
NAKANO, S ;
KUWANO, Y .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (01) :508-510
[6]   PRINCIPLES FOR CONTROLLING THE OPTICAL AND ELECTRICAL-PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON DEPOSITED FROM A SILANE PLASMA [J].
HISHIKAWA, Y ;
TSUDA, S ;
WAKISAKA, K ;
KUWANO, Y .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (09) :4227-4231
[7]   INTERFERENCE-FREE DETERMINATION OF THE OPTICAL-ABSORPTION COEFFICIENT AND THE OPTICAL GAP OF AMORPHOUS-SILICON THIN-FILMS [J].
HISHIKAWA, Y ;
NAKAMURA, N ;
TSUDA, S ;
NAKANO, S ;
KISHI, Y ;
KUWANO, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (05) :1008-1014
[8]  
KAWASAKI M, 1993, MATER RES SOC SYMP P, V297, P139, DOI 10.1557/PROC-297-139
[9]   GROWTH-KINETICS OF SILICON THIN-FILM STUDIED BY HYDROGEN RADICAL AND ION IRRADIATION [J].
MIYAZAKI, S ;
INOUE, Y ;
KIRIKI, Y ;
HIROSE, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (11) :2382-2386
[10]  
SCHMITT JPM, 1979, THIN SOLID FILMS, V62, P335