EXAFS STUDIES OF LIQUID SEMICONDUCTORS

被引：3

作者：

INUI, M

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷

关键词：

EXAFS; STRUCTURE; SE; TE; AS2SE3; LIQUID; HIGH TEMPERATURE; SEMICONDUCTOR-TO-METAL TRANSITION;

D O I：

10.7567/JJAPS.32S2.165

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

EXAFS is a useful probe of studying the local structure of disordered systems. We have developed a new sample cell and carried out EXAFS measurements for liquid semiconductors such as Se, Te and As2Se3, whose electronic properties often show metallic behaviour at high temperatures and pressures. EXAFS has been found to give useful information on the neighboring configuration around a central atom as long as the atoms are covalently bonded.

引用

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页码：165 / 169

页数：5

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