METHOD TO EXTRACT INTERFACE STATE PARAMETERS FROM MIS PARALLEL CONDUCTANCE TECHNIQUE

被引：24

作者：

SIMONNE, JJ ^{[1
]}

机构：

[1] CNRS, LAB AUTOM & APPL SPATIALES, TOULOUSE 31055, FRANCE

来源：

SOLID-STATE ELECTRONICS | 1973年 / 16卷 / 01期

关键词：

D O I：

10.1016/0038-1101(73)90133-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：121 / 124

页数：4

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