ELLIPSOMETRIC STUDY OF ADSORPTION COMPLEXES ON SILICON

[1] BOONSTRA AH, 1968, PHILIPS RES REPT S

[2] ELLIPSOMETRIC INVESTIGATION OF PHYSISORPTION AT LOW TEMPERATURES [J]. SURFACE SCIENCE, 1969, 13 (01) : 110 - &

[3] ELLIPSOMETRY IN SUB-MONOLAYER REGION [J]. SURFACE SCIENCE, 1969, 14 (01) : 52 - &

[4] Adsorption of gases in multimolecular layers [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1938, 60 : 309 - 319

[5] ELLIPSOMETRY AND CLEAN SURFACES OF SILICON AND GERMANIUM [J]. SURFACE SCIENCE, 1971, 27 (01) : 88 - +

[6] PLANE SPECIFICITY IN REACTION OF METHANOL AND ETHANOL VAPOR WITH CLEAN GERMANIUM [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1969, 73 (11) : 3844 - &

[7] MEYER F, IN PRESS

[8] VANARKEL AE, 1961, MOLECULEN KRISTALLEN

[9] AUGER ELECTRON SPECTROSCOPY MADE QUANTITATIVE BY ELLIPSOMETRIC CALIBRATION [J]. APPLIED PHYSICS LETTERS, 1971, 18 (06) : 226 - &

[10] VRAKKING JJ, PRIVATE COMMUNICATIO

[1] BOONSTRA AH, 1968, PHILIPS RES REPT S

[2] ELLIPSOMETRIC INVESTIGATION OF PHYSISORPTION AT LOW TEMPERATURES [J]. SURFACE SCIENCE, 1969, 13 (01) : 110 - &

[3] ELLIPSOMETRY IN SUB-MONOLAYER REGION [J]. SURFACE SCIENCE, 1969, 14 (01) : 52 - &

[4] Adsorption of gases in multimolecular layers [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1938, 60 : 309 - 319

[5] ELLIPSOMETRY AND CLEAN SURFACES OF SILICON AND GERMANIUM [J]. SURFACE SCIENCE, 1971, 27 (01) : 88 - +

[6] PLANE SPECIFICITY IN REACTION OF METHANOL AND ETHANOL VAPOR WITH CLEAN GERMANIUM [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1969, 73 (11) : 3844 - &

[7] MEYER F, IN PRESS

[8] VANARKEL AE, 1961, MOLECULEN KRISTALLEN

[9] AUGER ELECTRON SPECTROSCOPY MADE QUANTITATIVE BY ELLIPSOMETRIC CALIBRATION [J]. APPLIED PHYSICS LETTERS, 1971, 18 (06) : 226 - &

[10] VRAKKING JJ, PRIVATE COMMUNICATIO