BOUNDARY SCATTERING AND 1-F NOISE

被引：28

作者：

HOOGE, FN

KEDZIA, J

VANDAMME, LKJ

机构：

[1] Department of Electrical Engineering, Eindhoven University of Technology, Eindhoven

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 12期

关键词：

D O I：

10.1063/1.325947

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Noise measurements on thin bismuth films show that boundary scattering does not contribute to 1/f noise.

引用

收藏

页码：8087 / 8089

页数：3

相关论文

共 10 条

[1] The conductivity of thin metallic films according to the electron theory of metals
Fuchs, K
[J]. PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 : 100 - 108
[2] LATTICE SCATTERING CAUSES 1-F NOISE
HOOGE, FN
VANDAMME, LKJ
[J]. PHYSICS LETTERS A, 1978, 66 (04) : 315 - 316
[3] DISCUSSION OF RECENT EXPERIMENTS ON 1/F NOISE
HOOGE, FN
[J]. PHYSICA, 1972, 60 (01): : 130 - +
[4] 1/F-NOISE IN CONTINUOUS THIN GOLD FILMS
HOOGE, FN
HOPPENBROUWERS, AM
[J]. PHYSICA, 1969, 45 (03): : 386 - +
[5] 1-F NOISE IN THERMO EMF OF INTRINSIC AND EXTRINSIC SEMICONDUCTORS
KLEINPENNING, TG
[J]. PHYSICA, 1974, 77 (01): : 78 - 98
[6] TEMPERATURE-FLUCTUATIONS AND 1-F NOISE IN SEMICONDUCTORS AND METALS
KLEINPENNING, TGM
[J]. PHYSICA B & C, 1976, 84 (03): : 353 - 361
[7] CONCENTRATION AND MOBILITY OF CHARGE-CARRIERS IN THIN POLYCRYSTALLINE FILMS OF BISMUTH
KOCHOWSKI, S
OPILSKI, A
[J]. THIN SOLID FILMS, 1978, 48 (03) : 345 - 351
[8] INFLUENCE OF GRAIN-BOUNDARIES ON ELECTRICAL-RESISTIVITY OF THIN POLYCRYSTALLINE FILMS - CORRELATION BETWEEN MAYADAS-SHATZKES AND WISSMANN-WEDLER EQUATIONS
THIEME, F
KIRSTEIN, W
[J]. THIN SOLID FILMS, 1975, 30 (02) : 371 - 375
[9] VANDAMME LKJ, UNPUBLISHED
[10] FLICKER (1-F) NOISE - EQUILIBRIUM TEMPERATURE AND RESISTANCE FLUCTUATIONS
VOSS, RF
CLARKE, J
[J]. PHYSICAL REVIEW B, 1976, 13 (02): : 556 - 573