TESTS OF SEC STABILITY IN HIGH-FLUX PROTON-BEAMS

被引：6

作者：

AGORITSAS, V ^{[1
]}

WITKOVER, RL ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB,UPTON,NY 11973

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1979年 / 26卷 / 03期

关键词：

D O I：

10.1109/TNS.1979.4330034

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Secondary Emission Chamber (SEC) is used to measure the beam intensity in slow extracted beam channels of proton synchrotrons around the world. With the improvements in machine intensity, these monitors have been exposed to higher flux conditions than in the past. A change in sensitivity of up to 25% has been observed in the region around the beam spot. Using SEC's of special construction, a series of tests was performed at FNAL, BNL-AGS and CERN-PS. The results of these tests and conclusions about the construction of more stable SEC's are presented. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：3355 / 3357

页数：3