DIFFUSION IN GOLD-ALUMINIUM

被引：23

作者：

WEAVER, C

PARKINSON, DT

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1970年 / 22卷 / 176期

关键词：

D O I：

10.1080/14786437008228230

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：377 / +

页数：1

共 16 条

[1] MEASUREMENT OF ADHESION OF THIN FILMS [J].

BENJAMIN, P ;

WEAVER, C .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 254 (1277) :163-176

[2]

FRANCOMBE MH, 1967, THIN SOLID FILMS, V1, P353

[3] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[4] DIFFUSION LAYER GROWTH IN A BINARY SYSTEM [J].

GIBBS, GB .

JOURNAL OF NUCLEAR MATERIALS, 1966, 20 (03) :303-&

[5]

HANSEN M, 1958, CONSTITUTION BINARY, P69

[6] SOME FACTORS INFLUENCING THE ADHESION OF FILMS PRODUCED BY VACUUM EVAPORATION [J].

HEAVENS, OS .

JOURNAL DE PHYSIQUE ET LE RADIUM, 1950, 11 (07) :355-360

[7] ELECTRICAL CONDUCTIVITY OF THIN METALLIC FILMS WITH UNLIKE SURFACES [J].

LUCAS, MSP .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1632-&

[8]

SHUNK FA, 1969, CONSTITUTION BINARY

[9] LATTICE PARAMETERS EXPANSION COEFFICIENTS + EXTENT OF AL2AU PHASE [J].

STRAUMANIS, ME ;

CHOPRA, KS .

ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-FRANKFURT, 1964, 42 (5-6) :344-&

[10] MEASUREMENT OF DIFFUSION-INDUCED STRAINS AT METAL BOND INTERFACES [J].

TAKEI, WJ ;

FRANCOMB.MH .

SOLID-STATE ELECTRONICS, 1968, 11 (02) :205-&

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