THE MORPHOLOGY OF CARBON-FILMS AND SURFACES STUDIED BY PHOTOEMISSION ELECTRON-MICROSCOPY

被引:10
作者
WANG, CJ [1 ]
KORDESCH, ME [1 ]
机构
[1] OHIO UNIV,CONDENSED MATTER & SURFACE SCI PROGRAM,ATHENS,OH 45701
关键词
D O I
10.1016/0304-3991(91)90147-X
中图分类号
TH742 [显微镜];
学科分类号
摘要
Several types of high-density carbon thin films and the natural diamond (100) surface have been imaged using photoemission electron microscopy (PEEM). The material contrast and monolayer sensitivity of PEEM that arises from work function differences at the surface allows carbon films to be detected and localized before crystallites are formed. Material contrast can also be observed in films of seemingly identical morphology.
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收藏
页码:154 / 163
页数:10
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