TRANSMISSION ELECTRON-MICROSCOPE OBSERVATIONS OF EXTENDED AND UNEXTENDED DISLOCATION NODES IN SI AND GE/SI LAYERS USING WEAK-BEAM TECHNIQUE

被引：19

作者：

CULLIS, AG ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MET,OXFORD,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 98卷 / JUL期

关键词：

D O I：

10.1111/j.1365-2818.1973.tb03822.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：191 / 195

页数：5

共 9 条

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[2] OBSERVATIONS ON DISLOCATION NODES IN SILICON
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BROWN, LM
[J]. PHILOSOPHICAL MAGAZINE, 1965, 11 (114): : 1315 - &
[3] BROWN IM, 1964, DISCUSS FARADAY SOC, V38, P35
[4] CULLIS AG, 1972, 5TH P EUR C EL MICR, P532
[5] CULLIS AG, 1971, 25TH P ANN M EMAG CA, P320
[6] Hirth J.P., 1982, THEORY DISLOCATIONS
[7] DISSOCIATION OF DISLOCATIONS IN SILICON
RAY, ILF
COCKAYNE, DJ
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 325 (1563): : 543 - &
[8] ELECTRON MICROSCOPE IMAGE CONTRAST NEAR DISLOCATION NODES
SHAW, AMB
BROWN, LM
[J]. PHILOSOPHICAL MAGAZINE, 1967, 15 (136): : 797 - &
[9] DISLOCATION INTERACTIONS IN FACE-CENTRED CUBIC METALS, WITH PARTICULAR REFERENCE TO STAINLESS STEEL
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[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1959, 249 (1256): : 114 - &