LOT UNIFORMITY AND SMALL SAMPLE SIZES IN HARDNESS ASSURANCE

被引:15
作者
NAMENSON, A
机构
[1] US Naval Research Lab, Washington,, DC, USA
关键词
Failure Analysis - Quality Assurance - Standards;
D O I
10.1109/23.25488
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recent standard radiation test procedures allow wafer-level lot acceptance testing using as few as two or four parts with no failures. Such tests guarantee a high survivability of the accepted part only when the parts within a wafer exhibit a highly uniform response to radiation and when a large fraction of the wafers pass the test. The author points out the need for validating these tests, suggests techniques for doing so, and recommends modifications to current test procedures.
引用
收藏
页码:1506 / 1511
页数:6
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