DISTORTION OF DIFFERENTIATED DEFLECTION ANALYZER CURRENT

被引:9
作者
GERLACH, RL
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1972年 / 9卷 / 02期
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D O I
10.1116/1.1317717
中图分类号
O59 [应用物理学];
学科分类号
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页码:1043 / &
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GERLACH, RL ;
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[2]   ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].
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[3]   RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J].
TAYLOR, NJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :792-&