THE EFFECT OF PLASMA CURE TEMPERATURE ON SPIN-ON GLASS

被引:9
作者
NAMATSU, H
MINEGISHI, K
机构
[1] NTTLSI Laboratories, Kanagawa, 243-01, 3-1, Morinosato Wakamiya, Atsugi-shi
[2] NTT Electronics Technology Corporation, Kanagawa, 243-01, 3-1, Morinosato Wakamiya, Atsugi-shi
关键词
D O I
10.1149/1.2056209
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The quality of spin-on glass (SOG) films, which are widely used as interlevel planarization dielectrics, can be improved by curing in gas plasma. The etch rate of SOG films plasma-cured in oxygen ambient is lower than that of films nitrogen-cured in a furnace, which is the commonly used SOG curing method. The etch rate decreases with increasing plasma cure temperature. Furthermore, a high-temperature plasma cure reduces the number of the silanols, which act as adsorption sites of water. However, plasma curing at 400-degrees-C promotes hot carrier degradation. There is an optimum plasma curing temperature that can improve film quality with a minimum of hot carrier degradation. That temperature is thought to be around 300-degrees-C. The plasma curing process at 300-degrees-C can also produce crack-free SOG films.
引用
收藏
页码:1121 / 1125
页数:5
相关论文
共 16 条
[1]   PLANARIZATION OF PHOSPHORUS-DOPED SILICON DIOXIDE [J].
ADAMS, AC ;
CAPIO, CD .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (02) :423-429
[2]  
CHIANG C, 1987, P IEEE VLSI MULTILEV, P404
[3]  
CHU JK, 1986, 3RD P INT IEEE VLSI, P474
[4]  
ELKINS P, 1986, P IEEE VLSI MULTILEV, P102
[5]  
FRITZSHE H, 1986, P IEEE VLSI MULTILEV, P45
[6]  
HIRASHITA N, 1989, P IEEE RELIABILITY P, P61
[7]   APPLICATION OF SURFACE REFORMED THICK SPIN-ON-GLASS TO MOS DEVICE PLANARIZATION [J].
ITO, S ;
HOMMA, Y ;
SASAKI, E ;
UCHIMURA, S ;
MORISHIMA, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (04) :1212-1218
[8]   REDUCTION OF WATER IN INORGANIC SPIN ON GLASS [J].
ITO, S ;
HOMMA, Y ;
SASAKI, E .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (05) :2696-2703
[9]   DETECTION OF WATER-RELATED CHARGE IN ELECTRONIC DIELECTRICS [J].
LIFSHITZ, N ;
SMOLINSKY, G .
APPLIED PHYSICS LETTERS, 1989, 55 (04) :408-410
[10]  
LIFSHITZ N, 1991, IEEE ELECTR DEVICE L, V12, P141