SELECTED-AREA DIFFRACTION PATTERNS AND MAGNIFIED LAUE-DIFFRACTION IMAGES BY X-RAY MICROSCOPY

被引：13

作者：

KOZAKI, S

OHKAWA, T

HASHIMOTO, H

机构：

来源：

关键词：

D O I：

10.1063/1.1656882

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3967 / +

页数：1

共 16 条

[1] [Anonymous], XRAY MICROSCOPY
[2] COSSLETT VE, 1956, P S CAVENDISH LABORA
[3] DIRECT OBSERVATION OF DISLOCATIONS IN SILICON SINGLE CRYSTALS USING A WHITE X-RAY RADIATION TECHNIQUE
FIERMANS, L
[J]. PHYSICA STATUS SOLIDI, 1964, 6 (01): : 169 - 172
[4] FUJIWARA T, 1964, JPN J APPL PHYS, V3, P129
[5] FUJIWARA T, 1941, J SCI HIROSHIMA U A, V11, P93
[6] OBSERVATIONS OF PENDELLOSUNG FRINGES AND IMAGES OF DISLOCATIONS BY X-RAY SHADOW MICROGRAPHS OF SI CRYSTALS
HASHIMOTO, H
KOZAKI, S
OHKAWA, T
[J]. APPLIED PHYSICS LETTERS, 1965, 6 (01) : 16 - +
[7] ICHINOKAWA T, 1963, 3 INT S XRAY OPT XRA, P255
[8] KOZAKI S, 1964, JAPANESE PHYSICAL SO, P233
[9] KOZAKI S, 1965, JAPANESE APPLIED PHY, P137
[10] KOZAKI S, 1965, JAPANESE APPLIED PHY, V112, P113