A CONTACTLESS METHOD FOR DETERMINATION OF CARRIER LIFETIME, SURFACE RECOMBINATION VELOCITY, AND DIFFUSION CONSTANT IN SEMICONDUCTORS

被引：49

作者：

WALDMEYER, J ^{[1
]}

机构：

[1] BROWN BOVERI & CO LTD,RES CTR,CH-5405 BADEN,SWITZERLAND

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 06期

关键词：

D O I：

10.1063/1.341097

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1977 / 1983

页数：7

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