HIGH-PERFORMANCE W-BAND MONOLITHIC PSEUDOMORPHIC INGAAS HEMT LNAS AND DESIGN ANALYSIS METHODOLOGY

被引:28
作者
WANG, H
DOW, GS
ALLEN, BR
TON, TN
TAN, KL
CHANG, KW
CHEN, T
BERENZ, J
LIN, TS
LIU, PH
STREIT, DC
BUI, SB
RAGGIO, JJ
CHOW, PD
机构
[1] TRW CO INC,DEPT MEASUREMENT ENGN,REDONDO BEACH,CA 90278
[2] TRW CO INC,DEPT MILLIMETER WAVE TECHNOL,REDONDO BEACH,CA 90278
[3] TRW CO INC,DIV ELECTR & TECHNOL,MMIC DESIGN SECT,REDONDO BEACH,CA 90278
[4] TRW CO INC,DIV ELECTR TECHNOL,ADV MICROELECTR LAB,REDONDO BEACH,CA 90278
[5] TRW CO INC,ADV MICROELECTR LAB,GAAS MAT SECT,REDONDO BEACH,CA 90278
[6] TRW CO INC,DIV ELECTR & TECHNOL,MICROWAVE TECHNOL & DEV OPERAT,REDONDO BEACH,CA 90278
关键词
Integrated Circuits; Monolithic--Millimeter Waves - Semiconducting Gallium Arsenide - Semiconducting Indium Compounds - Transistors; High Electron Mobility--Design;
D O I
10.1109/22.121716
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-performance W-band monolithic one- and two-stage low noise amplifiers (LNA's) based on pseudomorphic InGaAs/GaAs HEMT devices have been developed. The one-stage amplifier has a measured noise figure of 5.1 dB with an associated gain of 7 dB from 92 to 95 GHz, and the two-stage amplifier has a measured small signal gain of 13.3 dB at 94 GHz and 17 dB at 89 GHz with a noise figure of 5.5 dB from 91 to 95 GHz. An eight-stage LNA built by cascading four of these monolithic two-stage LNA chips demonstrates 49 dB gain and 6.5 dB noise figure at 94 GHz. A rigorous analysis procedure was incorporated in the design, including accurate active device modeling and full-wave EM analysis of passive structures. The first pass success of these LNA chip designs indicates the importance of a rigorous design/analysis methodology in the millimeter wave monolithic IC development.
引用
收藏
页码:417 / 428
页数:12
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