APPARATUS FOR MEASUREMENT OF STRESS IN VACUUM EVAPORATED FILMS

被引:14
作者
PRIEST, JR
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D O I
10.1063/1.1717249
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:1349 / +
页数:1
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共 15 条
[1]  
BLUMBERG RH, AM J PHYS
[2]  
CAMPBELL DS, 1961, VST, P313
[4]  
CRITTENDEN EC, 1950, PHYS REV, V78, P349
[5]  
FREEDMAN JF, TO BE PUBLISHED
[6]   THE CAUSE OF STRESS IN EVAPORATED METAL FILMS [J].
HOFFMAN, RW ;
DANIELS, RD ;
CRITTENDEN, EC .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (414) :497-500
[7]   EVIDENCE FOR COLLAPSE OF LATTICE VACANCY AGGREGATES TO FORM DISLOCATION RINGS [J].
HOFFMAN, RW ;
ANDERS, FJ ;
CRITTENDEN, EC .
JOURNAL OF APPLIED PHYSICS, 1953, 24 (02) :231-232
[8]   ANNEALING SILICON MONOXIDE FILMS ON ALUMINIUM MIRRORS [J].
HOLLAND, L ;
PUTNER, T ;
BALL, R .
BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (04) :167-168
[9]   STRESS IN VERY THIN VACUUM-EVAPORATED FILMS OF SILVER [J].
KINOSITA, K ;
KONDO, H ;
SAWAMURA, I .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1960, 15 (05) :942-943
[10]   PENETRATION OF MAGNETIC FIELDS INTO SUPERCONDUCTORS .3. MEASUREMENTS ON THIN FILMS OF TIN, LEAD AND INDIUM [J].
LOCK, JM .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1951, 208 (1094) :391-408