MICRO-PIXE AS A COMPLEMENT TO ELECTRON-PROBE MICROANALYSIS IN MINERALOGY

被引：50

作者：

CAMPBELL, JL ^{[1
]}

MAXWELL, JA ^{[1
]}

TEESDALE, WJ ^{[1
]}

WANG, JX ^{[1
]}

CABRI, LJ ^{[1
]}

机构：

[1] CANADA CTR MINERAL & ENERGY TECHNOL,OTTAWA K1A 0G1,ONTARIO,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 44卷 / 03期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0168-583X(90)90650-J

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Standardization methods and limits of detection for the analogous techniques of micro-PIXE and electron-probe microanalysis (EPMA) are compared in the context of mineralogical applications, specifically in the analysis of sulfide and oxide minerals. Micro-PIXE benefits by adopting and adapting techniques from EPMA and the two techniques are often deployed in tandem to provide a full characterization spanning major, minor and trace elements. Various examples are given of work in progress. © 1990.

引用

页码：347 / 356

页数：10

共 14 条

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