PIXE ANALYSIS OF THICK TARGETS

[1] SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02): : 381 - 384

[2] PROTON-INDUCED X-RAY-EMISSION IN TRACE ANALYSIS OF HUMAN TOOTH ENAMEL AND DENTIN [J]. INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1976, 27 (5-6): : 279 - 290

[3] GOLD TRACES ON WEDGE-SHAPED ARTIFACTS FROM LATE NEOLITHIC OF SOUTHERN SCANDINAVIA ANALYZED BY PROTON-INDUCED X-RAY-EMISSION SPECTROSCOPY [J]. ARCHAEOMETRY, 1976, 18 (FEB) : 39 - &

[4] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02): : 385 - 393

[5] ENHANCEMENT IN PIXE ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 61 - 65

[6] ANDERSEN HH, 1977, STOPPING POWER RANGE, V3

[7] PIXE ANALYSIS OF CARIES RELATED TRACE-ELEMENTS IN TOOTH ENAMEL [J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3): : 323 - 326

[8] COINCIDENCE MEASUREMENTS BETWEEN SCATTERED PARTICLES AND X-RAYS TO OBTAIN HIGH DEPTH AND MASS RESOLUTION [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3): : 227 - 232

[9] X-RAY ANALYSIS OF THICK TARGETS WITH ALPHA-PARTICLES [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 148 (02): : 407 - 413

[10] RUTHERFORD BACKSCATTERING AS A TOOL TO DETERMINE ELECTRONIC STOPPING POWERS IN SOLIDS [J]. THIN SOLID FILMS, 1973, 19 (02) : 247 - 257

[1] SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02): : 381 - 384

[2] PROTON-INDUCED X-RAY-EMISSION IN TRACE ANALYSIS OF HUMAN TOOTH ENAMEL AND DENTIN [J]. INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1976, 27 (5-6): : 279 - 290

[3] GOLD TRACES ON WEDGE-SHAPED ARTIFACTS FROM LATE NEOLITHIC OF SOUTHERN SCANDINAVIA ANALYZED BY PROTON-INDUCED X-RAY-EMISSION SPECTROSCOPY [J]. ARCHAEOMETRY, 1976, 18 (FEB) : 39 - &

[4] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02): : 385 - 393

[5] ENHANCEMENT IN PIXE ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 61 - 65

[6] ANDERSEN HH, 1977, STOPPING POWER RANGE, V3

[7] PIXE ANALYSIS OF CARIES RELATED TRACE-ELEMENTS IN TOOTH ENAMEL [J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3): : 323 - 326

[8] COINCIDENCE MEASUREMENTS BETWEEN SCATTERED PARTICLES AND X-RAYS TO OBTAIN HIGH DEPTH AND MASS RESOLUTION [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3): : 227 - 232

[9] X-RAY ANALYSIS OF THICK TARGETS WITH ALPHA-PARTICLES [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 148 (02): : 407 - 413

[10] RUTHERFORD BACKSCATTERING AS A TOOL TO DETERMINE ELECTRONIC STOPPING POWERS IN SOLIDS [J]. THIN SOLID FILMS, 1973, 19 (02) : 247 - 257