COINCIDENCE MEASUREMENTS BETWEEN SCATTERED PARTICLES AND X-RAYS TO OBTAIN HIGH DEPTH AND MASS RESOLUTION

被引：8

作者：

BAHIR, G

KALISH, R

TSERRUYA, I

机构：

[1] TECHNION ISRAEL INST TECHNOL,INST SOLID STATE,HAIFA,ISRAEL

[2] WEIZMANN INST SCI,REHOVOT 76100,ISRAEL

来源：

NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(80)91258-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：227 / 232

页数：6

共 15 条

[1] SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION
AHLBERG, M
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02): : 381 - 384
[2] Z1 SCALING FOR IMPACT-PARAMETER DEPENDENCE OF INNER-SHELL IONIZATION BY HEAVY-IONS
ANDERSEN, JU
LAEGSGAARD, E
LUND, M
MOAK, CD
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 507 - 515
[3] DETERMINATION OF DEPTH OF IMPURITY ATOMS IN BULK MATERIAL BY PROTON-INDUCED X-RAYS
BENKA, O
GERETSCHLAGER, M
PAUL, H
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (11) : 5090 - 5093
[4] FELDMAN LC, 1976, ION BEAM SURFACE LAY, V2, P735
[5] EFFECT OF FLUORESCENCE ON DETERMINATION OF DEPTH DISTRIBUTIONS BY ION INDUCED X-RAYS
KNUDSON, AR
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 445 - 449
[6] SMALL-ANGLE MULTIPLE-SCATTERING OF IONS IN SCREENED COULOMB REGION .2. LATERAL SPREAD
MARWICK, AD
SIGMUND, P
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 126 (03): : 317 - 323
[7] LARGE DEPTH PROFILE MEASUREMENTS OF D, HE-3, AND LI-6 BY DEUTERON INDUCED NUCLEAR-REACTIONS
MOLLER, W
HUFSCHMIDT, M
KAMKE, D
[J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 140 (01): : 157 - 165
[8] ION-INDUCED X-RAY SPECTROSCOPY AS A METHOD TO DETERMINE DEPTH DISTRIBUTION OF TRACE-ELEMENTS
PABST, W
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 124 (01): : 143 - 147
[9] DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY
PABST, W
[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 120 (03): : 543 - 545
[10] RANDALL RR, 1976, PHYS REV A, V13, P204, DOI 10.1103/PhysRevA.13.204