DETERMINATION OF DEPTH OF IMPURITY ATOMS IN BULK MATERIAL BY PROTON-INDUCED X-RAYS

被引：23

作者：

BENKA, O ^{[1
]}

GERETSCHLAGER, M ^{[1
]}

PAUL, H ^{[1
]}

机构：

[1] JOHANNES KEPLER UNIV,INST PHYS,A-4045 LINZ,AUSTRIA

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 11期

关键词：

D O I：

10.1063/1.322458

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5090 / 5093

页数：4

共 8 条

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[2] MEASUREMENT OF RELATIVE PROTON-INDUCED L-SUBSHELL IONIZATION CROSS-SECTIONS OF AG, SB AND AU [J].

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[3] SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS [J].

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BORGGREEN, J ;

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[4]

Northcliffe L. S., 1970, NUCL DATA A, V7, P233

[5] ION-INDUCED X-RAY SPECTROSCOPY AS A METHOD TO DETERMINE DEPTH DISTRIBUTION OF TRACE-ELEMENTS [J].

PABST, W .

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[6] DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY [J].

PABST, W .

NUCLEAR INSTRUMENTS & METHODS, 1974, 120 (03) :543-545

[7] FULL-RANGE SOLUTION FOR MEASUREMENT OF THIN-FILM SURFACE DENSITIES WITH PROTON-EXCITED X-RAYS [J].

REUTER, FW ;

SMITH, HP .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :4228-&

[8]

Storm E., 1970, ATOM DATA NUCL DATA, V7, P565, DOI [10.1016/S0092-640X(70)80017-1, DOI 10.1016/S0092-640X(70)80017-1]

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