FULL-RANGE SOLUTION FOR MEASUREMENT OF THIN-FILM SURFACE DENSITIES WITH PROTON-EXCITED X-RAYS

被引：46

作者：

REUTER, FW

SMITH, HP

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 10期

关键词：

D O I：

10.1063/1.1660900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：4228 / &

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