SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION

[1] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02): : 385 - 393

[2] AHLBERG M, TO BE PUBLISHED

[3] COMBINED USE OF HE BACKSCATTERING AND HE-INDUCED X-RAYS IN STUDY OF ANODICALLY GROWN OXIDE-FILMS ON GAAS [J]. THIN SOLID FILMS, 1973, 19 (01) : 81 - 89

[4] ELEMENTAL TRACE ANALYSIS OF SMALL SAMPLES BY PROTON-INDUCED X-RAY-EMISSION [J]. ANALYTICAL CHEMISTRY, 1975, 47 (06) : 855 - 860

[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +

[6] MUSKET RG, 1973, THIN SOLID FILMS, V19, P69, DOI 10.1016/0040-6090(73)90025-4

[7] ION-INDUCED X-RAY SPECTROSCOPY AS A METHOD TO DETERMINE DEPTH DISTRIBUTION OF TRACE-ELEMENTS [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 124 (01): : 143 - 147

[8] DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 120 (03): : 543 - 545

[9] FULL-RANGE SOLUTION FOR MEASUREMENT OF THIN-FILM SURFACE DENSITIES WITH PROTON-EXCITED X-RAYS [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) : 4228 - &

[10] LARGE DEPTH CONCENTRATION PROFILE DETERMINATION USING GAMMA-RAYS PROTON-INDUCED REACTIONS - DEVELOPMENT OF A GLOBAL METHOD [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 126 (02): : 303 - 308

[1] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02): : 385 - 393

[2] AHLBERG M, TO BE PUBLISHED

[3] COMBINED USE OF HE BACKSCATTERING AND HE-INDUCED X-RAYS IN STUDY OF ANODICALLY GROWN OXIDE-FILMS ON GAAS [J]. THIN SOLID FILMS, 1973, 19 (01) : 81 - 89

[4] ELEMENTAL TRACE ANALYSIS OF SMALL SAMPLES BY PROTON-INDUCED X-RAY-EMISSION [J]. ANALYTICAL CHEMISTRY, 1975, 47 (06) : 855 - 860

[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +

[6] MUSKET RG, 1973, THIN SOLID FILMS, V19, P69, DOI 10.1016/0040-6090(73)90025-4

[7] ION-INDUCED X-RAY SPECTROSCOPY AS A METHOD TO DETERMINE DEPTH DISTRIBUTION OF TRACE-ELEMENTS [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 124 (01): : 143 - 147

[8] DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 120 (03): : 543 - 545

[9] FULL-RANGE SOLUTION FOR MEASUREMENT OF THIN-FILM SURFACE DENSITIES WITH PROTON-EXCITED X-RAYS [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) : 4228 - &

[10] LARGE DEPTH CONCENTRATION PROFILE DETERMINATION USING GAMMA-RAYS PROTON-INDUCED REACTIONS - DEVELOPMENT OF A GLOBAL METHOD [J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 126 (02): : 303 - 308