EFFECT OF FLUORESCENCE ON DETERMINATION OF DEPTH DISTRIBUTIONS BY ION INDUCED X-RAYS

被引：7

作者：

KNUDSON, AR

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(78)90906-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：445 / 449

页数：5

相关论文

共 10 条

[1] SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION
AHLBERG, M
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02): : 381 - 384
[2] DETERMINATION OF DEPTH OF IMPURITY ATOMS IN BULK MATERIAL BY PROTON-INDUCED X-RAYS
BENKA, O
GERETSCHLAGER, M
PAUL, H
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (11) : 5090 - 5093
[3] COMBINED USE OF HE BACKSCATTERING AND HE-INDUCED X-RAYS IN STUDY OF ANODICALLY GROWN OXIDE-FILMS ON GAAS
FELDMAN, LC
POATE, JM
ERMANIS, F
SCHWARTZ, B
[J]. THIN SOLID FILMS, 1973, 19 (01) : 81 - 89
[4] FELDMAN LC, 1976, ION BEAM SURFACE LAY, V2, P735
[5] INNER-SHELL VACANCY PRODUCTION IN ION-ATOM COLLISIONS
GARCIA, JD
FORTNER, RJ
KAVANAGH, TM
[J]. REVIEWS OF MODERN PHYSICS, 1973, 45 (02) : 111 - 177
[6] USE OF ION-BEAM TECHNIQUES TO CHARACTERIZE THIN PLASMA GROWN GAAS AND GAALAS OXIDE-FILMS
KAUFFMAN, RL
FELDMAN, LC
CHANG, RPH
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 619 - 622
[7] ION-INDUCED X-RAY SPECTROSCOPY AS A METHOD TO DETERMINE DEPTH DISTRIBUTION OF TRACE-ELEMENTS
PABST, W
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 124 (01): : 143 - 147
[8] DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY
PABST, W
[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 120 (03): : 543 - 545
[9] FULL-RANGE SOLUTION FOR MEASUREMENT OF THIN-FILM SURFACE DENSITIES WITH PROTON-EXCITED X-RAYS
REUTER, FW
SMITH, HP
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) : 4228 - &
[10] QUANTITATIVE-ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X-RAYS
REUTER, W
LURIO, A
CARDONE, F
ZIEGLER, JF
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 3194 - 3202