FIELD EMISSION STUDY OF SELENIUM AND TELLURIUM THIN FILMS ON A TUNGSTEN SURFACE

[11] SOKOLSKAYA IL, 1969, IZV AN SSSR FIZ+, V33, P544

[12] SOKOLSKAYA IL, 1969, IZV AKAD NAUK SSSR F, V11, P3434

[13] SOKOLSKAYA IL, 1964, FIZ TVERD TELA, V6, P1786

[14] SUGATA E, 1963, TECHNOL REPTS OSAKA, V13, P331

[15] THE EFFECT OF ELECTRIC FIELD ON ADSORBED LAYERS OF CESIUM ON VARIOUS REFRACTORY METALS [J]. SURFACE SCIENCE, 1964, 2 : 177 - 187

[16] WHEELER A, 1953, STRUCTURE PROPERTIES, P439

[11] SOKOLSKAYA IL, 1969, IZV AN SSSR FIZ+, V33, P544

[12] SOKOLSKAYA IL, 1969, IZV AKAD NAUK SSSR F, V11, P3434

[13] SOKOLSKAYA IL, 1964, FIZ TVERD TELA, V6, P1786

[14] SUGATA E, 1963, TECHNOL REPTS OSAKA, V13, P331

[15] THE EFFECT OF ELECTRIC FIELD ON ADSORBED LAYERS OF CESIUM ON VARIOUS REFRACTORY METALS [J]. SURFACE SCIENCE, 1964, 2 : 177 - 187

[16] WHEELER A, 1953, STRUCTURE PROPERTIES, P439