X-RAY INTERFERENCE METHOD FOR STUDYING INTERFACE STRUCTURES

被引：117

作者：

ROBINSON, IK ^{[1
]}

TUNG, RT ^{[1
]}

FEIDENHANSL, R ^{[1
]}

机构：

[1] RISO NATL LAB,DK-4000 ROSKILDE,DENMARK

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.38.3632

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：3632 / 3635

页数：4

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