THIN FILM ADHESION - EFFECT OF GLOW DISCHARGE ON SUBSTRATE

被引：9

作者：

STODDART, CT

CLARKE, DR

ROBBIE, CJ

机构：

来源：

JOURNAL OF ADHESION | 1970年 / 2卷 / OCT期

关键词：

D O I：

10.1080/0021846708544600

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

引用

页码：270 / &

共 16 条

[1] STYLUS OR SCRATCH METHOD FOR THIN FILM ADHESION MEASUREMENT - SOME OBSERVATIONS AND COMMENTS [J].

BUTLER, DW ;

STODDART, CT ;

STUART, PR .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (06) :877-&

[2]

BUTLER DW, ASPECTS ADHESION, V6

[3]

BUTLER DW, UNPUBLISHED WORK

[4] FORMATION OF THIN FILM CIRCUITS USING PREFERENTIAL NUCLEATION [J].

CASWELL, HL ;

BUDO, Y .

SOLID-STATE ELECTRONICS, 1965, 8 (05) :479-&

[5] INFLUENCE OF ELECTRIC FIELD ON GROWTH OF THIN METAL FILMS [J].

CHOPRA, KL .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (06) :2249-&

[6] EFFECT OF GLOW DISCHARGE ON INSULATORS AS OBSERVED IN SCANNING ELECTRON MICROSCOPE [J].

CLARKE, DR ;

STODDART, CT ;

ROBBIE, CJ .

JOURNAL OF MATERIALS SCIENCE, 1970, 5 (04) :364-&

[7]

DAVIES DW, PRIVATE COMMUNICATIO

[8]

FLORESCU NA, 1957, VACUUM, V7, P46

[9]

GALVIN GD, 1968, T ASME F, V90, P850

[10]

Holland L., 1964, PROPERTIES GLASS SUR

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