RADIATIVE LIFETIME IN SEMICONDUCTORS FOR INFRARED DETECTION

被引:82
作者
HUMPHREYS, RG
机构
来源
INFRARED PHYSICS | 1986年 / 26卷 / 06期
关键词
D O I
10.1016/0020-0891(86)90054-0
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:337 / 342
页数:6
相关论文
共 8 条
[1]   RADIANT REFRIGERATION BY SEMICONDUCTOR DIODES [J].
BERDAHL, P .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (03) :1369-1374
[2]  
ELLIOT CT, 1981, HDB SEMICONDUCTORS, V4, P759
[3]  
ELLIOTT CT, 1985, ELECTRON LETT, V21, P451
[4]   RADIATIVE LIFETIME IN SEMICONDUCTORS FOR INFRARED DETECTION [J].
HUMPHREYS, RG .
INFRARED PHYSICS, 1983, 23 (03) :171-175
[5]  
MALYUTENKO VK, 1984, SOV PHYS SEMICOND+, V18, P211
[6]  
STERN F, 1963, SOLID STATE PHYS, V15, P299
[7]   PHOTON-RADIATIVE RECOMBINATION OF ELECTRONS AND HOLES IN GERMANIUM [J].
VANROOSBROECK, W ;
SHOCKLEY, W .
PHYSICAL REVIEW, 1954, 94 (06) :1558-1560
[8]   THE CHARACTERISTICS OF MINORITY-CARRIER EXCLUSION IN NARROW DIRECT GAP SEMICONDUCTORS [J].
WHITE, AM .
INFRARED PHYSICS, 1985, 25 (06) :729-741