DEPENDENCE OF CD DIFFUSION AND ELECTRICAL CONDUCTIVITY IN CDS ON CD PARTIAL PRESSURE AND TEMPERATURE

The diffusion coefficient of Cd in undoped single crystal CdS has been measured at 850 °C as a function of Cd pressure, pCd, by a radiotracer method. The electrical conductivity of similar CdS samples has also been measured as a function of pCd in the temperature range 660 to 950 °C. It is concluded that the defects V″Cd and Cd ix are responsible for Cd diffusion at 850 °C and that a satisfactory account of the results can be given in terms of Cd interstitials and vacancies plus a residual shallow foreign donor. A model for the defect structure in CdS at 850 °C is presented in terms of Cd vacancies and interstitials. Copyright © 1969 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim