LOW-FREQUENCY NOISE IN SCHOTTKY-BARRIER DIODES

被引:95
作者
KLEINPENNING, TGM
机构
[1] Eindhoven University of Technology, Department of Electrical Engineering, Eindhoven
关键词
D O I
10.1016/0038-1101(79)90103-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The low-frequency excess noise in Schottky barrier diodes has been investigated. In the ideal case where the saturation current is completely determined by thermionic emission of electrons, no 1/f{hook} noise will be produced in the barrier. The presence of trap states in the depletion region can lead to generation-recombination noise. At sufficient high forward currents 1/f{hook} noise can be generated in the series resistance of the Schottky diode. Deviations from the ideal diode, for example as a result of edge effects, produce 1/f{hook} noise and increase at the same time the ideality factor. It is empirically found that the 1/f{hook} noise level decreases very rapidly if the ideality factor tends to unity. © 1979.
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页码:121 / 128
页数:8
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