Electron diffraction studies on thin films III powder patterns containing anomalies produced by secondary scattering

被引：10

作者：

Germer, LH ^{[1
]}

机构：

[1] Bell Tel Labs, New York, NY USA

来源：

PHYSICAL REVIEW | 1942年 / 61卷 / 5/6期

关键词：

D O I：

10.1103/PhysRev.61.309

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：309 / 312

页数：4

共 8 条

[1] BARTH T, 1924, NORSK GEOL TIDSSKR, V8, P281
[2] Diffraction experiments with very fine electron beams.
Boersch, H.
[J]. ZEITSCHRIFT FUR PHYSIK, 1940, 116 (7-8): : 469 - 479
[3] Electron diffraction studies of thin films - I - Structure of very thin films
Germer, LH
[J]. PHYSICAL REVIEW, 1939, 56 (01): : 58 - 71
[4] JAMES RW, 1932, PHILOS MAG, V12, P81
[5] Pauling L, 1932, Z KRISTALLOGR, V81, P1
[6] Reflection of fast electrons in single crystals
Raether, Heinz
[J]. ZEITSCHRIFT FUR PHYSIK, 1932, 78 (7-8): : 527 - 538
[7] 1939, PHYS REV, V56, P58
[8] 1941, PHYS REV, V60, P447