FLUX CREEP IN BULK Y-BA-CU-O AND BI-PB-SR-CA-CU-O

被引：9

作者：

POLAK, M ^{[1
]}

KOTTMAN, P ^{[1
]}

MAJOROS, M ^{[1
]}

KEDROVA, M ^{[1
]}

PLECHACEK, V ^{[1
]}

机构：

[1] STATE RES INST MAT,CS-11312 PRAGUE,CZECHOSLOVAKIA

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1990年 / 3卷 / 02期

关键词：

D O I：

10.1088/0953-2048/3/2/003

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Sensitive measurements of voltage-current characteristics in Y 1Ba2Cu3O7-x and Bi 1.8Pb0.2Sr2Ca2Cu2O 10+x bulk samples have been performed. The corresponding E(J) characteristics were found to have an exponential form for values of E=0.1 to 1 mu V cm-1 in magnetic fields up to 100 mT at the liquid nitrogen temperature. The behaviour of the measured curves corresponds to the flux creep model. The activation energy U related to flux pinning was determined. The role of disturbing voltages in high-sensitivity measurements is discussed.

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页码：67 / 72

页数：6

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