AGING PHENOMENA IN HEAVILY DOPED (P+) MICROMACHINED SILICON CANTILEVER BEAMS

被引:30
作者
TABIBAZAR, M [1 ]
WONG, K [1 ]
KO, W [1 ]
机构
[1] CASE WESTERN RESERVE UNIV,ELECT ENGN & BIOMED ENGN,CLEVELAND,OH 44106
基金
美国国家科学基金会;
关键词
D O I
10.1016/0924-4247(92)80167-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Micromachined (100) silicon cantilever beams with and without coating materials have been excited to study their aging process. The center frequency and the full width at half amplitude (FWHA) of the spectra are obtained as a function of time to study internal friction. The dynamic Young's modulus is determined from the resonance frequency of the cantilever beams. In uncoated silicon cantilever beams, the dynamic Young's modulus increases as a function of aging from 129 to 136 GPa in 2 x 10(9) cycles. The Young's modulus in these heavily boron-doped beams is smaller than the Young's modulus in silicon with low doping. In coated cantilever beams, the effective dynamic Young's modulus decreases as function of aging and the amount of this change depends on the coating material, being largest in the Al/Si system. In all the cantilever beams the FWHA increases as a function of time, indicating that the amount of energy dissipated internally increases as the cantilevers age. Also, the observed FWHA values of the resonances in these systems are too large to be caused by thermoelastic effects; microcracks are probably generated as the beams age. This is the first study of aging in micromachined p+ heavily boron-doped single-crystal silicon.
引用
收藏
页码:199 / 206
页数:8
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