MEASUREMENT OF SURFACE RECOMBINATION VELOCITY IN SEMICONDUCTORS BY DIFFRACTION FROM PICOSECOND TRANSIENT FREE-CARRIER GRATINGS

被引：161

作者：

HOFFMAN, CA ^{[1
]}

JARASIUNAS, K ^{[1
]}

GERRITSEN, HJ ^{[1
]}

NURMIKKO, AV ^{[1
]}

机构：

[1] BROWN UNIV,DIV ENGN,PROVIDENCE,RI 02912

来源：

APPLIED PHYSICS LETTERS | 1978年 / 33卷 / 06期

关键词：

D O I：

10.1063/1.90428

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：536 / 539

页数：4

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