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STUDIES OF THE CHARGING OF INSULATORS IN ESCA
被引:75
作者
:
WAGNER, CD
论文数:
0
引用数:
0
h-index:
0
WAGNER, CD
机构
:
来源
:
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
|
1980年
/ 18卷
/ 04期
关键词
:
D O I
:
10.1016/0368-2048(80)80022-3
中图分类号
:
O433 [光谱学];
学科分类号
:
0703 ;
070302 ;
摘要
:
引用
收藏
页码:345 / 349
页数:5
相关论文
共 6 条
[1]
RELIABILITY OF PEAK 1S OF CARBON CONTAMINATION AS INTERNAL ENERGY STANDARD IN PHOTOELECTRON-SPECTRA
CONTOUR, JP
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
CONTOUR, JP
MOUVIER, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
MOUVIER, G
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1975,
7
(01)
: 85
-
90
[2]
CHARGE-INDUCED RELAXATION IN POLYMERS
DUKE, CB
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
DUKE, CB
FABISH, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
FABISH, TJ
[J].
PHYSICAL REVIEW LETTERS,
1976,
37
(16)
: 1075
-
1078
[3]
CHARGING EFFECT IN X-RAY PHOTOELECTRON SPECTROMETRY
EBEL, MF
论文数:
0
引用数:
0
h-index:
0
机构:
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
EBEL, MF
EBEL, H
论文数:
0
引用数:
0
h-index:
0
机构:
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
EBEL, H
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1974,
3
(03)
: 169
-
180
[4]
IMPORTANCE OF PHOTOCONDUCTION IN ESCA EXPERIMENTS
GONSKA, H
论文数:
0
引用数:
0
h-index:
0
GONSKA, H
FREUND, HJ
论文数:
0
引用数:
0
h-index:
0
FREUND, HJ
HOHLNEICHER, G
论文数:
0
引用数:
0
h-index:
0
HOHLNEICHER, G
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1977,
12
(04)
: 435
-
441
[5]
NEFEDOV VI, 1977, J ELECTRON SPECTROSC, V10, P121, DOI 10.1016/0368-2048(77)85010-X
[6]
WAGNER CD, APPLIED SURFACE ANAL
←
1
→
共 6 条
[1]
RELIABILITY OF PEAK 1S OF CARBON CONTAMINATION AS INTERNAL ENERGY STANDARD IN PHOTOELECTRON-SPECTRA
CONTOUR, JP
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
CONTOUR, JP
MOUVIER, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
UNIV PARIS 7,LAB PHYS CHIM INSTR,2 PL JUSSIEU,75005 PARIS,FRANCE
MOUVIER, G
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1975,
7
(01)
: 85
-
90
[2]
CHARGE-INDUCED RELAXATION IN POLYMERS
DUKE, CB
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
DUKE, CB
FABISH, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
XEROX CORP,WEBSTER RES CTR,WEBSTER,NY 14580
FABISH, TJ
[J].
PHYSICAL REVIEW LETTERS,
1976,
37
(16)
: 1075
-
1078
[3]
CHARGING EFFECT IN X-RAY PHOTOELECTRON SPECTROMETRY
EBEL, MF
论文数:
0
引用数:
0
h-index:
0
机构:
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
EBEL, MF
EBEL, H
论文数:
0
引用数:
0
h-index:
0
机构:
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
EBEL, H
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1974,
3
(03)
: 169
-
180
[4]
IMPORTANCE OF PHOTOCONDUCTION IN ESCA EXPERIMENTS
GONSKA, H
论文数:
0
引用数:
0
h-index:
0
GONSKA, H
FREUND, HJ
论文数:
0
引用数:
0
h-index:
0
FREUND, HJ
HOHLNEICHER, G
论文数:
0
引用数:
0
h-index:
0
HOHLNEICHER, G
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1977,
12
(04)
: 435
-
441
[5]
NEFEDOV VI, 1977, J ELECTRON SPECTROSC, V10, P121, DOI 10.1016/0368-2048(77)85010-X
[6]
WAGNER CD, APPLIED SURFACE ANAL
←
1
→