DEMONSTRATION OF REDUCED SOURCE SIZE BROADENING WITH A JOHANN FOCUSING ELLIPTIC SPECTROGRAPH AND THEORY OF THE 2ND-ORDER SOURCE BROADENING

被引：10

作者：

HAMMEL, BA ^{[1
]}

PHILLION, DW ^{[1
]}

RUGGLES, LE ^{[1
]}

机构：

[1] SANDIA NATL LABS,ALBUQUERQUE,NM 87185

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 07期

关键词：

D O I：

10.1063/1.1141949

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A Johann focusing elliptical spectrograph has been developed for the measurement of high-resolution x-ray spectra from a spatially extended source. The instrument was designed for the study of high-density, high-temperature plasmas produced by z-pinch implosion or ion-beam bombardment on pulsed-power accelerators. We have constructed and tested this instrument, and have demonstrated an improvement in resolution over what we obtain with a standard circular detector when viewing an extended source. Analytic results for the second-order source broadening due to a finite source size have been obtained and verified by ray tracing. Also given is a simple parametric equation for the Johann crossover curve in terms of either the ellipse sweep angle λ or the Bragg angle θB.

引用

页码：1920 / 1925

页数：6

共 7 条

[1]

BAILEY J, 1988, B AM PHYS SOC, V33, P1866

[2] ELLIPTICAL SPECTROGRAPH GATED MICROCHANNEL-PLATE DETECTOR FOR TIME-RESOLVED SPECTRAL MEASUREMENTS IN THE X-RAY REGION [J].