TRIODE PLASMA ETCHING

被引:13
作者
MINKIEWICZ, VJ
CHAPMAN, BN
机构
[1] IBM Research Laboratory, San Jose
关键词
D O I
10.1063/1.90746
中图分类号
O59 [应用物理学];
学科分类号
摘要
Reactive-plasma etching is conventionally carried out using one power supply to both generate the glow discharge and to control the flux and energy of ion bombardment on the substrate. A three-electrode, or triode, configuration is described in which these two functions are controlled quasi-independently; results obtained with this arrangement are described. These results are somewhat similar to those obtained with a diode RIE system, except that control of the substrate voltage allows another degree of freedom over etch rates, etch selectivity, and wall profiles.
引用
收藏
页码:192 / 193
页数:2
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