MEASUREMENT OF X-RAY-DIFFRACTION ANGLES OF PERFECT MONOCRYSTALS WITH HIGH-ACCURACY USING A SINGLE-CRYSTAL DIFFRACTOMETER

被引：27

作者：

HARTWIG, J ^{[1
]}

GROSSWIG, S ^{[1
]}

机构：

[1] ACAD SCI GDR,ZENT INST PHYS ERDE,DDR-6900 JENA,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 115卷 / 02期

关键词：

D O I：

10.1002/pssa.2211150203

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：369 / 382

页数：14

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