SCANNING ELECTROCHEMICAL MICROSCOPY - APPARATUS AND TWO-DIMENSIONAL SCANS OF CONDUCTIVE AND INSULATING SUBSTRATES

被引：213

作者：

KWAK, J ^{[1
]}

BARD, AJ ^{[1
]}

机构：

[1] UNIV TEXAS,DEPT CHEM,AUSTIN,TX 78712

来源：

关键词：

D O I：

10.1021/ac00192a003

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1794 / 1799

页数：6

共 14 条

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[3] ATOMIC FORCE MICROSCOPE
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[5] MEASUREMENTS WITHIN THE DIFFUSION LAYER USING A MICROELECTRODE PROBE
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WINQUIST, S
[J]. ANALYTICAL CHEMISTRY, 1986, 58 (04) : 844 - 848
[6] SPATIOTEMPORAL DESCRIPTION OF THE DIFFUSION LAYER WITH A MICROELECTRODE PROBE
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TOPLE, R
WIGHTMAN, RM
[J]. ANALYTICAL CHEMISTRY, 1987, 59 (15) : 2005 - 2010
[7] DIFFUSIONAL DISTORTION IN THE MONITORING OF DYNAMIC EVENTS
ENGSTROM, RC
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[J]. ANALYTICAL CHEMISTRY, 1988, 60 (07) : 652 - 656
[8] FABRICATION AND CHARACTERIZATION OF MICROTIPS FOR INSITU SCANNING TUNNELING MICROSCOPY
GEWIRTH, AA
CRASTON, DH
BARD, AJ
[J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1989, 261 (2B): : 477 - 482
[9] Heineman W. R., 1984, ELECTROANALYTICAL CH, V13
[10] HIGH-RESOLUTION DEPOSITION AND ETCHING OF METALS WITH A SCANNING ELECTROCHEMICAL MICROSCOPE
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CRASTON, DH
BARD, AJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (06): : 1873 - 1876