X-RAY LINE SHIFT ANALYSIS IN VACUUM-EVAPORATED SILVER FILMS

被引：19

作者：

SEN, S ^{[1
]}

HALDER, SK ^{[1
]}

SENGUPTA, SP ^{[1
]}

机构：

[1] INDIAN ASS CULTIVATION SCI,DEPT GEN PHYS & X-RAYS,CALCUTTA 32,INDIA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1973年 / 6卷 / 17期

关键词：

D O I：

10.1088/0022-3727/6/17/304

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1978 / 1985

页数：8

共 35 条

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[2] X-RAY LINE BROADENING ANALYSIS OF GOLD FILMS LESS THAN 1000 A THICK [J].

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VOOK, RW .

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[3]

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[4]

BORIE B, 1963, THIN FILMS, pCH2

[5]

CAMPBELL DS, 1970, HDB THIN FILM TECHNO, pCH12

[6]

CHOPRA KL, 1969, THIN FILM PHENOMENA, pCH5

[7]

CHOUDHURI AK, 1969, INDIAN J PURE AP PHY, V7, P158

[8]

CHRISTIAN JW, 1963, ALLOYING BEHAVIOUR E, V29

[9] CRYSTAL GROWTH AND ORIENTATIONS IN VACUUM-CONDENSED SILVER FILMS AND THEIR SYSTEMATIC DEPENDANCE ON RESIDUAL AIR PRESSURE, FILM THICKNESS, RATE OF DEPOSITION AND SUBSTRATE TEMPERATURE [J].

DUTTA, PK ;

WILMAN, H .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (06) :839-&

[10] STRUCTURE AND GROWTH OF SILVER FILMS CONDENSED AT OBLIQUE VAPOUR INCIDENCE, AND THEIR DEPENDENCE ON FILM THICKNESS AND RESIDUAL AIR PRESSURE [J].

DUTTA, PK ;

WILMAN, H .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (12) :1971-&

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