ANGLE OF INCIDENCE DEPENDENCE OF ELECTRON-BEAM INDUCED CRYSTAL CURRENT FROM AG(100) AND AG(111) SURFACES

被引：13

作者：

TJENG, LH

BARTSTRA, RW

SAWATZKY, GA

机构：

来源：

SURFACE SCIENCE | 1989年 / 211卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(89)90770-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：187 / 197

页数：11

共 37 条

[1] EXPERIMENTAL STUDY OF INFLUENCE OF ANGLE OF INCIDENCE OF PRIMARY ELECTRONS ON PRODUCTION OF AUGER EMISSION [J].

ALLIE, G ;

BLANC, E ;

DUFAYARD, D ;

STERN, RM .

SURFACE SCIENCE, 1974, 46 (01) :188-196

[2]

BAIRD RJ, 1977, PHYS REV B, V15, P666, DOI 10.1103/PhysRevB.15.666

[3] SMALL-ATOM APPROXIMATIONS FOR PHOTOELECTRON SCATTERING IN THE INTERMEDIATE-ENERGY RANGE [J].

BARTON, JJ ;

SHIRLEY, DA .

PHYSICAL REVIEW B, 1985, 32 (04) :1906-1920

[4]

BRUNING H, 1954, PHYSICS APPLICATION

[5] DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION [J].

BULLOCK, EL ;

FADLEY, CS .

PHYSICAL REVIEW B, 1985, 31 (02) :1212-1215

[6] QUANTITATIVE CHARACTERIZATION OF ABRUPT INTERFACES BY ANGLE-RESOLVED AUGER-ELECTRON EMISSION [J].

CHAMBERS, SA ;

GREENLEE, TR ;

SMITH, CP ;

WEAVER, JH .

PHYSICAL REVIEW B, 1985, 32 (06) :4245-4248

[7] INCIDENT BEAM EFFECTS IN MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION [J].

CHAMBERS, SA ;

VITOMIROV, IM ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 36 (06) :3007-3015

[8] ATOMIC-STRUCTURE OF THE CU/SI(111) INTERFACE BY HIGH-ENERGY CORE-LEVEL AUGER-ELECTRON DIFFRACTION [J].

CHAMBERS, SA ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1985, 32 (02) :581-587

[9] DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001) [J].

CHAMBERS, SA ;

CHEN, HW ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 33 (12) :8810-8813

[10] ANOMALOUS PARTICLE PENETRATION IN PERFECT CRYSTALS [J].

DEWAMES, RE ;

HALL, WF ;

LEHMAN, GW .

PHYSICAL REVIEW, 1966, 148 (01) :181-&

← 1 2 3 4 →